DocumentCode :
3552630
Title :
A microwave GaAs field-effect transistor
Author :
Hooper, W.W. ; Hower, P.L.
Author_Institution :
Fairchild Research and Development, Palo Alto, Calif.
Volume :
13
fYear :
1967
fDate :
1967
Firstpage :
38
Lastpage :
38
Abstract :
The characteristies of a GaAs FET which uses a Schottky Barrier for the gate are described. As a result of the high mobility of electrons in GaAs and the small contact geometries attainable, experimental n-channel devices have been fabricated which have a maximum frequency of oscillation of about 3 GHz. The device is an interdigitated structure, fabricated on a 2-3 micron n-type GaAs film. This film is grown from the vapor phase on a semi-insulating GaAs substrate. Ohmic source and drain contacts are obtained by alloying a mixture of Ag, In, and Ge. The gate is evaporated aluminium.
Keywords :
Alloying; Aluminum; Electron mobility; Frequency; Gallium arsenide; Geometry; Microwave FETs; Microwave devices; Schottky barriers; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1967 International
Type :
conf
DOI :
10.1109/IEDM.1967.187800
Filename :
1474881
Link To Document :
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