DocumentCode
3552668
Title
Bonding of beam lead integrated circuits
Author
Howland, F.L. ; Clark, J.E. ; Eleftherion, P.
Author_Institution
Bell Telephone Laboratories, Allentown, Pa.
Volume
13
fYear
1967
fDate
1967
Firstpage
76
Lastpage
76
Abstract
The development of the sealed-junction, beam-lead silicon integrated circuit permits new freedom in the assembly of complex functional circuits. Because of the intrinsic capabilities of this silicon device technology, handling, registering, and bonding techniques which are capable of achieving high yields at manufacturable rates are being developed. For the device, the beams are utilized as the prime elements for handling and registration of the chip to the pattern of conductors on a substrate. Requirements and procedures for these operations, are briefly described.
Keywords
Assembly; Bonding forces; Conductors; Copper; Gold; Integrated circuit packaging; Integrated circuit yield; Joining processes; Metallization; Silicon devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1967 International
Type
conf
DOI
10.1109/IEDM.1967.187835
Filename
1474916
Link To Document