• DocumentCode
    3552668
  • Title

    Bonding of beam lead integrated circuits

  • Author

    Howland, F.L. ; Clark, J.E. ; Eleftherion, P.

  • Author_Institution
    Bell Telephone Laboratories, Allentown, Pa.
  • Volume
    13
  • fYear
    1967
  • fDate
    1967
  • Firstpage
    76
  • Lastpage
    76
  • Abstract
    The development of the sealed-junction, beam-lead silicon integrated circuit permits new freedom in the assembly of complex functional circuits. Because of the intrinsic capabilities of this silicon device technology, handling, registering, and bonding techniques which are capable of achieving high yields at manufacturable rates are being developed. For the device, the beams are utilized as the prime elements for handling and registration of the chip to the pattern of conductors on a substrate. Requirements and procedures for these operations, are briefly described.
  • Keywords
    Assembly; Bonding forces; Conductors; Copper; Gold; Integrated circuit packaging; Integrated circuit yield; Joining processes; Metallization; Silicon devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1967 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1967.187835
  • Filename
    1474916