Title :
Development and characterization of varactor diodes for millimeter wavelenghts
Author :
Orman, C. ; Goff, M.
Author_Institution :
Sylvania Electric Products Inc., Woburn, Mass.
Abstract :
The GaAs varactors described here are P+NN+ mesa devices with base widths (distance between P-+ and N+regions) made as narrow as possible to achieve high cutoff frequency. Routine dimensions are now 1 to 2 microns using as thin a P+ diffusion as the epitaxial layer thickness permits. Diffusion depth is typically 1.5 to 2.0 microns. Metallization processing has contacted P-+ regions thinner than one micron deep without shorting. Epitaxial layer doping level (ND) is controlled to achieve high (25-45v) or low (10-25v) voltage breakdown devices.
Keywords :
Cutoff frequency; Dielectric breakdown; Diodes; Doping; Epitaxial layers; Gallium arsenide; Metallization; Neodymium; Varactors; Voltage control;
Conference_Titel :
Electron Devices Meeting, 1967 International
DOI :
10.1109/IEDM.1967.187843