All-epitaxial bipolar transistors have been fabricated in silicon-on-sapphire films which exhibit a common-emitter low frequency current gain h
feof 10 at room temperature. The value of h
feincreases approximately as the square of the absolute temperature, which suggests recombination by charged coulomb centers in the base region. Monotonic increase in h
fewith collector current up to 100 mA (emitter area is 0.8 × 1.2 sq. mils) is probably due to trap-filling in the base region. No conductivity modulation, which would result in beta fall-off, is seen up to 500 mA of collector current. This is a narrow (

M), heavily doped (

cm
-3) base region.