• DocumentCode
    3552762
  • Title

    Device design considerations for an ultra-high voltage (>1600 volts) high frequency switching transistor

  • Author

    Myers, D.K. ; Turner, S.A.

  • Volume
    13
  • fYear
    1967
  • fDate
    1967
  • Firstpage
    156
  • Lastpage
    156
  • Abstract
    A 1600-volt switching transistor has been developed for use in an electronic gyro suspension system. This paper describes the design criteria and processes for this NPN silicon device. The major requirements for this transistor are to obtain a stable collector-base breakdown voltage of > 1600 volts, a collector-emitter saturation voltage of < 4.0 volts and an ftspecification of 40MHz. Two methods have been used for fabricating the transistor. One method employs a deep double diffused structure and the other uses an epitaxial grown base layer and a diffused emitter structure. Both methods utilize an etched mesa junction with oxide passivation and have produced devices which meet the required specification.
  • Keywords
    Breakdown voltage; Corona; Electric breakdown; Etching; Frequency; Passivation; Process design; Protection; Shape control; Silicon devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1967 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1967.187920
  • Filename
    1475001