• DocumentCode
    3552791
  • Title

    An empirical study of on-chip parallelism

  • Author

    Bailey, Mary L. ; Snyder, Lawrence

  • Author_Institution
    Dept. of Comput. Sci., Washington Univ., Seattle, WA, USA
  • fYear
    1988
  • fDate
    12-15 Jun 1988
  • Firstpage
    160
  • Lastpage
    165
  • Abstract
    A methodology is presented for empirically determining the amount of parallelism on a CMOS VLSI chip. Six chips are measured, and the effect of input choice and circuit size is studied. The unexpectedly low parallelism measured here suggests that certain strategies for parallel simulators may be doomed, and earlier efforts to extrapolate parallelism from small circuits to large circuits may have been overly optimistic
  • Keywords
    CMOS integrated circuits; VLSI; decoding; digital filters; digital simulation; microprocessor chips; multiplying circuits; shift registers; CMOS VLSI chip; IIR digital filter; RISC microprocessors; circuit size; decoder; empirical study; multiplier; on-chip parallelism; parallel simulators; shift register; Circuit simulation; Computer science; Distortion measurement; Driver circuits; Parallel processing; Power measurement; Probes; Semiconductor device measurement; Switching circuits; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1988. Proceedings., 25th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    0-8186-0864-1
  • Type

    conf

  • DOI
    10.1109/DAC.1988.14752
  • Filename
    14752