DocumentCode
3552830
Title
Insulated gate field effect transistor integrated circuits with silicon gates
Author
Faggin, F. ; Klein, T. ; Vadasz, L.
Author_Institution
Fairchild Semiconductor Research and Development Laboratory, Palo Alto, Calif.
Volume
14
fYear
1968
fDate
1968
Firstpage
22
Lastpage
22
Abstract
The Silicon Gate Technology is a new approach to fabricating insulated gate field effect transistor circuits, in which the metal gate electrode is replaced by a doped, silicon electrode. The work function difference between the gate electrode and semiconductor bulk will now be determined by the doping of the gate electrode. This leads to normally off p-channel devices with threshold voltages typically between 1.1 v and 2.5 v on material with 1000Å gate oxide. It is a self-aligned gate structure and has a buried-gate electrode which allows crossover of gate regions and closer spacing of source-drain contact. The fabrication needs 4 masking steps and was found to be compatible with existing planar technology.
Keywords
Electrodes; FET integrated circuits; Fabrication; Insulation; Integrated circuit technology; Lead compounds; Semiconductor device doping; Semiconductor materials; Silicon on insulator technology; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1968 International
Type
conf
DOI
10.1109/IEDM.1968.187948
Filename
1475473
Link To Document