DocumentCode :
3552830
Title :
Insulated gate field effect transistor integrated circuits with silicon gates
Author :
Faggin, F. ; Klein, T. ; Vadasz, L.
Author_Institution :
Fairchild Semiconductor Research and Development Laboratory, Palo Alto, Calif.
Volume :
14
fYear :
1968
fDate :
1968
Firstpage :
22
Lastpage :
22
Abstract :
The Silicon Gate Technology is a new approach to fabricating insulated gate field effect transistor circuits, in which the metal gate electrode is replaced by a doped, silicon electrode. The work function difference between the gate electrode and semiconductor bulk will now be determined by the doping of the gate electrode. This leads to normally off p-channel devices with threshold voltages typically between 1.1 v and 2.5 v on material with 1000Å gate oxide. It is a self-aligned gate structure and has a buried-gate electrode which allows crossover of gate regions and closer spacing of source-drain contact. The fabrication needs 4 masking steps and was found to be compatible with existing planar technology.
Keywords :
Electrodes; FET integrated circuits; Fabrication; Insulation; Integrated circuit technology; Lead compounds; Semiconductor device doping; Semiconductor materials; Silicon on insulator technology; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1968 International
Type :
conf
DOI :
10.1109/IEDM.1968.187948
Filename :
1475473
Link To Document :
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