• DocumentCode
    3552830
  • Title

    Insulated gate field effect transistor integrated circuits with silicon gates

  • Author

    Faggin, F. ; Klein, T. ; Vadasz, L.

  • Author_Institution
    Fairchild Semiconductor Research and Development Laboratory, Palo Alto, Calif.
  • Volume
    14
  • fYear
    1968
  • fDate
    1968
  • Firstpage
    22
  • Lastpage
    22
  • Abstract
    The Silicon Gate Technology is a new approach to fabricating insulated gate field effect transistor circuits, in which the metal gate electrode is replaced by a doped, silicon electrode. The work function difference between the gate electrode and semiconductor bulk will now be determined by the doping of the gate electrode. This leads to normally off p-channel devices with threshold voltages typically between 1.1 v and 2.5 v on material with 1000Å gate oxide. It is a self-aligned gate structure and has a buried-gate electrode which allows crossover of gate regions and closer spacing of source-drain contact. The fabrication needs 4 masking steps and was found to be compatible with existing planar technology.
  • Keywords
    Electrodes; FET integrated circuits; Fabrication; Insulation; Integrated circuit technology; Lead compounds; Semiconductor device doping; Semiconductor materials; Silicon on insulator technology; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1968 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1968.187948
  • Filename
    1475473