Title :
A microwave Schottky-barrier field-effect transistor
Author :
Drangeid, K.E. ; Middlehoek, S. ; Mohr, T.H. ; Wolf, P.
Author_Institution :
IBM Zurich Research Laboratory, Zurich, Switzerland
Abstract :
A silicon FET with a maximum frequency of oscillation fmaxof 10 GHz has been realized. Prime factor for the good microwave properties of the device is a newly designed gate which consists of a Schottky contact with a width of only 1 micron. This very small structure is made with the projection masking technology. The Schottky contact consists of evaporated Cr and Ni layers. Source and drain contacts are of the alloyed Au-Sb type. The channel is a thin epitaxial n-layer (d ≈ 0.2µ ρ ≈ 0.1 ohm-cm) on a high-resistive Si substrate.
Keywords :
Electrons; Microwave FET integrated circuits; Microwave devices; Microwave integrated circuits; Tunneling; Voltage;
Conference_Titel :
Electron Devices Meeting, 1968 International
DOI :
10.1109/IEDM.1968.188065