DocumentCode
3553200
Title
Thermally induced stability in transferred-electron amplifiers
Author
Upadhyayula, L.C. ; Perlman, B.S.
Author_Institution
RCA, Princeton, N.J.
Volume
16
fYear
1970
fDate
1970
Firstpage
56
Lastpage
56
Abstract
Recent publications discussed the effects of operating bias and circuit loading on the stability of transferred-electron amplifiers. During the course of our work on pulsed devices we found that it is not always possible to obtain stability by controlling the bias or circuit loading. However, by increasing either the ambient temperature or duty factor, some of the devices could be stabilized.
Keywords
Bandwidth; Circuit stability; Diodes; Electrons; Gunn devices; Microwave amplifiers; Oscillators; Power amplifiers; Solid state circuits; Thermal stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1970 International
Type
conf
DOI
10.1109/IEDM.1970.188252
Filename
1476364
Link To Document