Title :
Thermally induced stability in transferred-electron amplifiers
Author :
Upadhyayula, L.C. ; Perlman, B.S.
Author_Institution :
RCA, Princeton, N.J.
Abstract :
Recent publications discussed the effects of operating bias and circuit loading on the stability of transferred-electron amplifiers. During the course of our work on pulsed devices we found that it is not always possible to obtain stability by controlling the bias or circuit loading. However, by increasing either the ambient temperature or duty factor, some of the devices could be stabilized.
Keywords :
Bandwidth; Circuit stability; Diodes; Electrons; Gunn devices; Microwave amplifiers; Oscillators; Power amplifiers; Solid state circuits; Thermal stability;
Conference_Titel :
Electron Devices Meeting, 1970 International
DOI :
10.1109/IEDM.1970.188252
