• DocumentCode
    3553218
  • Title

    Polycrystalline silicon technology for bipolar integrated circuits

  • Author

    Schoeff, J.A.

  • Volume
    16
  • fYear
    1970
  • fDate
    1970
  • Firstpage
    74
  • Lastpage
    76
  • Abstract
    Polycrystalline silicon regions in the epitaxial layer of integrated circuits can perform isolation and buried-layer contact, and form surface elements such as field plates, capacitors, crossunders, and electrostatic shields. Recent experimental developments include new methods of selective growth and doping of these polycrystalline regions to provide very high voltage breakdown, low parasitic capacitance, and smooth surfaces with excellent pattern definition.
  • Keywords
    Bipolar integrated circuits; Capacitors; Dielectric breakdown; Doping; Electrostatics; Epitaxial layers; Integrated circuit technology; Isolation technology; Parasitic capacitance; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1970 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1970.188268
  • Filename
    1476380