DocumentCode
3553218
Title
Polycrystalline silicon technology for bipolar integrated circuits
Author
Schoeff, J.A.
Volume
16
fYear
1970
fDate
1970
Firstpage
74
Lastpage
76
Abstract
Polycrystalline silicon regions in the epitaxial layer of integrated circuits can perform isolation and buried-layer contact, and form surface elements such as field plates, capacitors, crossunders, and electrostatic shields. Recent experimental developments include new methods of selective growth and doping of these polycrystalline regions to provide very high voltage breakdown, low parasitic capacitance, and smooth surfaces with excellent pattern definition.
Keywords
Bipolar integrated circuits; Capacitors; Dielectric breakdown; Doping; Electrostatics; Epitaxial layers; Integrated circuit technology; Isolation technology; Parasitic capacitance; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1970 International
Type
conf
DOI
10.1109/IEDM.1970.188268
Filename
1476380
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