DocumentCode :
3553287
Title :
Ion implantation for junction field effect transistors compatible with integrated circuits
Author :
Gardner, K.R. ; Mac Rae, A.U.
Volume :
16
fYear :
1970
fDate :
1970
Firstpage :
144
Lastpage :
144
Abstract :
The ability to use junction field effect transistors in integrated circuits simplifies circuit design. This paper describes the techniques used in fabricating p-channel junction field effect transistors (J-FET) in an integrated circuit, using ion implantation and standard IC processing. This circuit contains resistors, transistors and three J-FETs on the same chip. The J-FETs are used as constant current sources and have a pinch-off voltage of less than 2 volts and an IDSSof ∼ 1 ma. The J-FETs are formed by ion implanting 5 × 1012/cm2B+at 100 keV, using SiO2as a mask to define the p-region which eventually becomes the channel region. The n-type gate is formed at the same time as the emitters of the transistors. The resultant circuits are characterized by a uniform J-FET pinch-off voltage and IDSS, reflecting the control associated with ion implantation.
Keywords :
Circuit synthesis; FET integrated circuits; Ion implantation; Resistors; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1970 International
Type :
conf
DOI :
10.1109/IEDM.1970.188331
Filename :
1476443
Link To Document :
بازگشت