• DocumentCode
    3553355
  • Title

    Surface charge transistor imaging array

  • Author

    Engeler, W.E. ; Tiemann, J.J. ; Baertsch, R.D.

  • Author_Institution
    General Electric Co., Schenectady, N. Y.
  • Volume
    17
  • fYear
    1971
  • fDate
    1971
  • Firstpage
    74
  • Lastpage
    74
  • Abstract
    Surface-charge transport offers the possibility of achieving both high sensitivity and high image cell density while requiring only a small number of connections to the imaging array itself. The high sensitivity is achieved by allowing the charge-storage reservoirs to integrate the image for an appropriate time which is long compared to the time required for read out. High sensitivity is maintained if part of the array can be read out at the same time that the remainder of the array is integrating the optical image.
  • Keywords
    Charge transfer; Degradation; Image sensors; Insulation; Integrated optics; Optical arrays; Optical imaging; Optical sensors; Signal to noise ratio; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1971 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1971.188396
  • Filename
    1476734