DocumentCode
3553355
Title
Surface charge transistor imaging array
Author
Engeler, W.E. ; Tiemann, J.J. ; Baertsch, R.D.
Author_Institution
General Electric Co., Schenectady, N. Y.
Volume
17
fYear
1971
fDate
1971
Firstpage
74
Lastpage
74
Abstract
Surface-charge transport offers the possibility of achieving both high sensitivity and high image cell density while requiring only a small number of connections to the imaging array itself. The high sensitivity is achieved by allowing the charge-storage reservoirs to integrate the image for an appropriate time which is long compared to the time required for read out. High sensitivity is maintained if part of the array can be read out at the same time that the remainder of the array is integrating the optical image.
Keywords
Charge transfer; Degradation; Image sensors; Insulation; Integrated optics; Optical arrays; Optical imaging; Optical sensors; Signal to noise ratio; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1971 International
Type
conf
DOI
10.1109/IEDM.1971.188396
Filename
1476734
Link To Document