DocumentCode :
3553373
Title :
One dimensional modeling of trim transistors
Author :
Senhouse, L.S., Jr.
Author_Institution :
Bell Telephone Laboratories, Inc., Murray Hill, N. J.
Volume :
17
fYear :
1971
fDate :
1971
Firstpage :
94
Lastpage :
94
Abstract :
A one dimensional approximation of the TRIM transistor consists of an electron-hole plasma in series with a high field near the intrinsic region. Our analysis of this type of structure differs from a previous one in that it allows a variable plasma width, W_{b}^{2} \\propto \\Bigg\\{ {{J_{b} \\over V_{T}^{2}}, \\epsilon \\ll 10^{4} \\hbox{ V/cm} \\atop {J_{b} \\over V_{T}}, \\epsilon > 10^{4} \\hbox{ V/cm}} V/cm frac{J_{b}}{V_{T}}, \\epsilon > 10^{4} V/cm where Wbis plasma width, Jbis base current density, VTis collector voltage and ε is electric field in the high field region. This expression is valid when W_{b} \\ll W_{T} where WTis the width of the near intrinsic region. Given a plasma density greater than the background doping density, the current gain ratio for pnp-type structures is identical in form to that of npn-type structures, i.e., \\beta DC \\approx frac{4L^{2}}{W_{b}^{2}} , where L is a carrier diffusion length for emitter injected carriers. The analytical closed form solution gives physical insight into TRIM design and compares favorably to the more accurate computer analysis.
Keywords :
Closed-form solution; Current density; Doping; Physics computing; Plasma density; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1971 International
Type :
conf
DOI :
10.1109/IEDM.1971.188413
Filename :
1476751
Link To Document :
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