DocumentCode :
3553406
Title :
Buried layer ion implanted resistors
Author :
Seidel, Thomas E. ; Gibson, W.C.
Volume :
17
fYear :
1971
fDate :
1971
Firstpage :
132
Lastpage :
134
Abstract :
Meg-Ohm silicon monolithic resistors have been fabricated with sheet resistance up to 120k Ω/□ using an implanted p-layer resistor which is buried under an implanted n-guard layer. The n-guard layer protects against slice to slice variations of the fixed surface charge and was made using phosphorus doses and energy of 1.5-5 × 1012P/cm2and 30 keV. Resistors have been fabricated up to 20 MΩ(and sheet resistances in the range of 7-120k Ω) using boron doses and energies of 1-3 × 1012B/cm2and 30-300 keV. The sheet resistance, voltage dependence of resistance, temperature coefficients, junction leakage and parasitic capacitance have been measured for different cases.
Keywords :
Boron; Capacitance measurement; Electrical resistance measurement; Parasitic capacitance; Protection; Resistors; Silicon; Surface resistance; Temperature dependence; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1971 International
Type :
conf
DOI :
10.1109/IEDM.1971.188443
Filename :
1476781
Link To Document :
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