DocumentCode
3553409
Title
A new approach to EBS technology
Author
Bierig, R.W. ; Simpson, J. ; Mozzi, R. ; Braun, Martin
Volume
17
fYear
1971
fDate
1971
Firstpage
136
Lastpage
136
Abstract
The use of electron bombarded silicon diodes (ESB, EBIRD, GEISHA, etc.) in vacuum tubes to generate, fast, high peak power video pulses and cw r.f. power was suggested by C. B. Norris of Stanford University. In principle, the EBS tube should be capable of providing high gain-bandwidth products and compact tube geometry. To date, only a few of the promised results have been achieved and the performance limitations have generally been: (a) degradation of the semiconductor reverse bias characteristic (b) inadequate diode cooling capability (c) some degree of incompatibility between the semiconductor diode and its mounting structure and standard tube processing procedures. We have designed, fabricated and tested single diode targets that are compatible with standard tube processing procedures. The electrical test results are consistent with the semiconductor target design. We have, to date, achieved video pulse output powers in excess of 1 kw and r.f. peak power output greater than 300W at 30 MC. We will describe the diode design, fabrication and test procedures presently being employed at Raytheon.
Keywords
Cooling; Degradation; Electron tubes; Fabrication; Geometry; Power generation; Pulse generation; Semiconductor device testing; Semiconductor diodes; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1971 International
Type
conf
DOI
10.1109/IEDM.1971.188446
Filename
1476784
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