DocumentCode :
3553409
Title :
A new approach to EBS technology
Author :
Bierig, R.W. ; Simpson, J. ; Mozzi, R. ; Braun, Martin
Volume :
17
fYear :
1971
fDate :
1971
Firstpage :
136
Lastpage :
136
Abstract :
The use of electron bombarded silicon diodes (ESB, EBIRD, GEISHA, etc.) in vacuum tubes to generate, fast, high peak power video pulses and cw r.f. power was suggested by C. B. Norris of Stanford University. In principle, the EBS tube should be capable of providing high gain-bandwidth products and compact tube geometry. To date, only a few of the promised results have been achieved and the performance limitations have generally been: (a) degradation of the semiconductor reverse bias characteristic (b) inadequate diode cooling capability (c) some degree of incompatibility between the semiconductor diode and its mounting structure and standard tube processing procedures. We have designed, fabricated and tested single diode targets that are compatible with standard tube processing procedures. The electrical test results are consistent with the semiconductor target design. We have, to date, achieved video pulse output powers in excess of 1 kw and r.f. peak power output greater than 300W at 30 MC. We will describe the diode design, fabrication and test procedures presently being employed at Raytheon.
Keywords :
Cooling; Degradation; Electron tubes; Fabrication; Geometry; Power generation; Pulse generation; Semiconductor device testing; Semiconductor diodes; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1971 International
Type :
conf
DOI :
10.1109/IEDM.1971.188446
Filename :
1476784
Link To Document :
بازگشت