• DocumentCode
    3553428
  • Title

    A new high-voltage planar transistor technology

  • Author

    Hower, P.L.

  • Volume
    17
  • fYear
    1971
  • fDate
    1971
  • Firstpage
    152
  • Lastpage
    152
  • Abstract
    A new technology for producing P-N planar junctions which show a breakdown voltage very close to that of a plane junction has been developed and applied to the fabrication of a small signal bipolar transistor with VCEO(sus) =1200 volts and a TV horizontal deflection device for line operated TV sets. The "corner" breakdown of the planar junction is eliminated by using a field plate--EQR structure and the breakdown usually occurring at the edge of the field plate is eliminated by using a layer of undoped polysilicon between the two electrodes which gives a linear voltage distribution at the surface.
  • Keywords
    Avalanche breakdown; Bipolar transistors; Breakdown voltage; Charge carrier lifetime; Degradation; Electric breakdown; Laboratories; Leakage current; P-n junctions; TV;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1971 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1971.188463
  • Filename
    1476801