DocumentCode
3553428
Title
A new high-voltage planar transistor technology
Author
Hower, P.L.
Volume
17
fYear
1971
fDate
1971
Firstpage
152
Lastpage
152
Abstract
A new technology for producing P-N planar junctions which show a breakdown voltage very close to that of a plane junction has been developed and applied to the fabrication of a small signal bipolar transistor with VCEO (sus) =1200 volts and a TV horizontal deflection device for line operated TV sets. The "corner" breakdown of the planar junction is eliminated by using a field plate--EQR structure and the breakdown usually occurring at the edge of the field plate is eliminated by using a layer of undoped polysilicon between the two electrodes which gives a linear voltage distribution at the surface.
Keywords
Avalanche breakdown; Bipolar transistors; Breakdown voltage; Charge carrier lifetime; Degradation; Electric breakdown; Laboratories; Leakage current; P-n junctions; TV;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1971 International
Type
conf
DOI
10.1109/IEDM.1971.188463
Filename
1476801
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