• DocumentCode
    3553493
  • Title

    An accurate and efficient gate level delay calculator for MOS circuits

  • Author

    Chang, Foong-Charn ; Chen, Chin-Fic ; Subramaniam, Prasad

  • Author_Institution
    AT&T Bell Lab., Murray Hill, NJ, USA
  • fYear
    1988
  • fDate
    12-15 June 1988
  • Firstpage
    282
  • Lastpage
    287
  • Abstract
    The authors describe an accurate and efficient gate-level delay calculator that automatically characterizes and computes the gate delays of MOS circuits. The high accuracy is attributed to a sophisticated delay model, which includes an accurate representation of the waveform, a consistent and meaningful definition of delay, a consideration of waveform slope effects at both the input and output of a gate, and an innovative approach for handling transmission gate circuits. The highly efficient delay characterization is accomplished through a fast timing simulation technique, a theorem that reduces a two-dimensional delay table into a scaled one-dimensional table, and an incremental characterization process. The delay calculator has been used in a production timing analyzer and a production multiple delay simulator since 1986. The multiple delay simulator performs 5000 times faster than a SPICE-like circuit simulator at only 15% cost of accuracy. Gate delay models, delay characterization, and practical examples are presented.<>
  • Keywords
    digital simulation; field effect integrated circuits; integrated logic circuits; logic CAD; logic gates; MOS circuits; SPICE-like circuit simulator; gate delay models; gate delays; gate-level delay calculator; incremental characterization process; production multiple delay simulator; production timing analyzer; scaled one-dimensional table; simulation technique; transmission gate circuits; two-dimensional delay table; waveform slope effects; Accuracy; Analytical models; Circuit simulation; Costs; Delay effects; Failure analysis; Logic; Production; Propagation delay; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1988. Proceedings., 25th ACM/IEEE
  • Conference_Location
    Anaheim, CA, USA
  • ISSN
    0738-100X
  • Print_ISBN
    0-8186-0864-1
  • Type

    conf

  • DOI
    10.1109/DAC.1988.14771
  • Filename
    14771