DocumentCode :
3553493
Title :
An accurate and efficient gate level delay calculator for MOS circuits
Author :
Chang, Foong-Charn ; Chen, Chin-Fic ; Subramaniam, Prasad
Author_Institution :
AT&T Bell Lab., Murray Hill, NJ, USA
fYear :
1988
fDate :
12-15 June 1988
Firstpage :
282
Lastpage :
287
Abstract :
The authors describe an accurate and efficient gate-level delay calculator that automatically characterizes and computes the gate delays of MOS circuits. The high accuracy is attributed to a sophisticated delay model, which includes an accurate representation of the waveform, a consistent and meaningful definition of delay, a consideration of waveform slope effects at both the input and output of a gate, and an innovative approach for handling transmission gate circuits. The highly efficient delay characterization is accomplished through a fast timing simulation technique, a theorem that reduces a two-dimensional delay table into a scaled one-dimensional table, and an incremental characterization process. The delay calculator has been used in a production timing analyzer and a production multiple delay simulator since 1986. The multiple delay simulator performs 5000 times faster than a SPICE-like circuit simulator at only 15% cost of accuracy. Gate delay models, delay characterization, and practical examples are presented.<>
Keywords :
digital simulation; field effect integrated circuits; integrated logic circuits; logic CAD; logic gates; MOS circuits; SPICE-like circuit simulator; gate delay models; gate delays; gate-level delay calculator; incremental characterization process; production multiple delay simulator; production timing analyzer; scaled one-dimensional table; simulation technique; transmission gate circuits; two-dimensional delay table; waveform slope effects; Accuracy; Analytical models; Circuit simulation; Costs; Delay effects; Failure analysis; Logic; Production; Propagation delay; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1988. Proceedings., 25th ACM/IEEE
Conference_Location :
Anaheim, CA, USA
ISSN :
0738-100X
Print_ISBN :
0-8186-0864-1
Type :
conf
DOI :
10.1109/DAC.1988.14771
Filename :
14771
Link To Document :
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