Title :
A 150 NSEC access, 1024 word by 1 bit p-channel switched capacitor RAM
Author :
Boll, H.J. ; Lynch, W.T.
Author_Institution :
Bell Laboratories, Murray Hill, New Jersey
Abstract :
IGFET switched-capacitor memory cells form the heart of a fully decoded dynamic. 1024-word by 1-bit p-channel random access memory. With 10V drive circuitry, chip access time is measured to be 150 nsec and cycle time is 300 nsec. On-chip power dissipation at a 300 nsec cycle is 100 mW (100 mW per bit) and is correspondingly lower at lower speeds. Refresh power at 100°C is less than 1 µW/bit.
Conference_Titel :
Electron Devices Meeting, 1972 International
DOI :
10.1109/IEDM.1972.249280