Title :
Functional level ATPG and fault coverage
Author :
Al-Arian, Sami A.
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. of South Florida, Tampa, FL, USA
Abstract :
An ATPG (automatic test program generation) for combinational circuits based on a functional description is presented. In addition, a functional fault coverage is defined and related to structural fault coverage. The advantages of the functional fault models include early estimates of reliability of the design in the design process, reduced CPU time for fault simulation, and fault grading of the developed test vectors. The author also reports on the evaluation of the functional vs. structural models through a correlation of their simulation results
Keywords :
automatic testing; combinatorial circuits; fault location; logic design; logic testing; automatic test program generation; combinational circuits; design reliability estimates; fault coverage; fault grading; fault simulation; functional description; functional fault models; structural models; test vectors; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computer science; Integrated circuit testing; Logic testing; Process design;
Conference_Titel :
Southeastcon '91., IEEE Proceedings of
Conference_Location :
Williamsburg, VA
Print_ISBN :
0-7803-0033-5
DOI :
10.1109/SECON.1991.147714
