Title :
Near-field scanning optical microscopy/spectroscopy in molecular aggregates and polymers
Author :
Vanden Bout, D.A. ; Higgins, D.A. ; Kerimo, J. ; Barbara, P.F.
Author_Institution :
Dept. of Chem., Minnesota Univ., Minneapolis, MN, USA
Abstract :
Near-field scanning optical microscopy (NSOM) combines high-resolution force microscopy with nanometer-resolution optical imaging. NSOM, therefore, has the power not only to resolve optical features on the tens of nanometer distance scale, but it can also correlate those features to topography. The results of the NSOM studies of numerous aggregated systems is reported.
Keywords :
composite materials; nanostructured materials; optical correlation; optical microscopy; optical polymers; optical resolving power; spectroscopy; aggregated systems; high-resolution force microscopy; molecular aggregates; nanometer distance scale; nanometer-resolution optical imaging; near-field scanning optical microscopy; optical correlation; optical resolving power; polymers; spectroscopy; topography; Aggregates; Atomic force microscopy; Crystals; Optical films; Optical imaging; Optical microscopy; Optical polymers; Optical recording; Spectroscopy; Surface topography;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 1996. QELS '96., Summaries of Papers Presented at the
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-444-0
