Near-field scanning optical microscopy/spectroscopy in molecular aggregates and polymers

Author

Vanden Bout, D.A. ; Higgins, D.A. ; Kerimo, J. ; Barbara, P.F.

Author_Institution

Dept. of Chem., Minnesota Univ., Minneapolis, MN, USA

fYear

1996

fDate

7-7 June 1996

Firstpage

14

Abstract

Near-field scanning optical microscopy (NSOM) combines high-resolution force microscopy with nanometer-resolution optical imaging. NSOM, therefore, has the power not only to resolve optical features on the tens of nanometer distance scale, but it can also correlate those features to topography. The results of the NSOM studies of numerous aggregated systems is reported.

Keywords

composite materials; nanostructured materials; optical correlation; optical microscopy; optical polymers; optical resolving power; spectroscopy; aggregated systems; high-resolution force microscopy; molecular aggregates; nanometer distance scale; nanometer-resolution optical imaging; near-field scanning optical microscopy; optical correlation; optical resolving power; polymers; spectroscopy; topography; Aggregates; Atomic force microscopy; Crystals; Optical films; Optical imaging; Optical microscopy; Optical polymers; Optical recording; Spectroscopy; Surface topography;

fLanguage

English

Publisher

ieee

Conference_Titel

Quantum Electronics and Laser Science Conference, 1996. QELS '96., Summaries of Papers Presented at the

Conference_Location

Anaheim, CA, USA

Print_ISBN

1-55752-444-0

Type

conf

Filename

865504