DocumentCode :
3553612
Title :
Design of micron MOS switching devices
Author :
Dennard, R.H. ; Kuhn, L. ; Yu, H.N.
Volume :
18
fYear :
1972
fDate :
1972
Firstpage :
168
Lastpage :
170
Abstract :
Modern photolithographic technology offers the capability of fabricating MOSFET devices of micron dimensions and less. It is by no means obvious that such small devices can be designed with suitable electrical characteristics for LSI switchivg applications. In this talk we will describe short-channel devices ( L_{eff} \\sim 1 µ) designed by scaling down larger devices with desirable electrical characteristics. Lateral and vertical dimensions, doping level, and operating voltages and currents are scaled in a self-consistent fashion. In this way small devices have been fabricated without the usual deleterious effects associated with short channels. The measured characteristics of these short-channel devices and the larger devices from which they were scaled will be compared.
Keywords :
Capacitance; Electric variables; Frequency measurement; Large scale integration; MOSFET circuits; Materials science and technology; Pollution measurement; Schottky barriers; Semiconductor impurities; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1972 International
Type :
conf
DOI :
10.1109/IEDM.1972.249198
Filename :
1477207
Link To Document :
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