DocumentCode :
3553710
Title :
New technique of doped oxide diffusion and its application to integrated circuit devices
Author :
Tanikawa, E. ; Takayama, O. ; Maeda, K.
Author_Institution :
Fujitsu Limited, Kawasaki, Japan
Volume :
19
fYear :
1973
fDate :
1973
Firstpage :
54
Lastpage :
57
Abstract :
A new technique of doped oxide diffusion is developed and investigated. In the present method, the doped oxide is deposited in an evacuated system from organic compound sources. We applied this method to every diffusion process in the fabrication of bipolar IC. The reproducibility of the "unsaturated diffusion" is much improved and less defect generation as compared with the conventional methods is confirmed, Its extensive applicability has standardized the diffusion process in which various kinds of techniques have been used.
Keywords :
Application specific integrated circuits; Bipolar integrated circuits; Diffusion processes; Fabrication; Impurities; Organic compounds; Oxidation; Reproducibility of results; Silicon; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1973 International
Type :
conf
DOI :
10.1109/IEDM.1973.188647
Filename :
1477524
Link To Document :
بازگشت