• DocumentCode
    3553712
  • Title

    The GaAs dual-gate FET with low noise and wide dynamic range

  • Author

    Asai, Shojiro ; Murai, Furnio ; Kodera, Hiroshi

  • Author_Institution
    Hitachi, Ltd., Kokubunji, Tokyo, Japan
  • Volume
    19
  • fYear
    1973
  • fDate
    1973
  • Firstpage
    64
  • Lastpage
    67
  • Abstract
    The benefits inherent in the tetrode structure and the potential of GaAs as the material are combined to realize a dual-gate FET with a low noise figure and a wide dynamic range at microwave frequencies. Following the newly constructed design theory of GaAs dual-gate FET, an improved device structure is derived and FET´s are fabricated using a Schottky barrier for the gate. The improved device exhibited a noise figure as low as 3dB and a power gain of 12dB at 4GHz. The stability factor and maximum stable gain are much larger than the single gate unit. By varying the 2nd gate bias, the power gain was controllable over a wide range of 30dB at 4GHz without significantly affecting the input impedance.
  • Keywords
    Dynamic range; Gain measurement; Gallium arsenide; Laboratories; Microwave FETs; Microwave frequencies; Noise figure; Packaging; Schottky barriers; Stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1973 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1973.188649
  • Filename
    1477526