DocumentCode
3553712
Title
The GaAs dual-gate FET with low noise and wide dynamic range
Author
Asai, Shojiro ; Murai, Furnio ; Kodera, Hiroshi
Author_Institution
Hitachi, Ltd., Kokubunji, Tokyo, Japan
Volume
19
fYear
1973
fDate
1973
Firstpage
64
Lastpage
67
Abstract
The benefits inherent in the tetrode structure and the potential of GaAs as the material are combined to realize a dual-gate FET with a low noise figure and a wide dynamic range at microwave frequencies. Following the newly constructed design theory of GaAs dual-gate FET, an improved device structure is derived and FET´s are fabricated using a Schottky barrier for the gate. The improved device exhibited a noise figure as low as 3dB and a power gain of 12dB at 4GHz. The stability factor and maximum stable gain are much larger than the single gate unit. By varying the 2nd gate bias, the power gain was controllable over a wide range of 30dB at 4GHz without significantly affecting the input impedance.
Keywords
Dynamic range; Gain measurement; Gallium arsenide; Laboratories; Microwave FETs; Microwave frequencies; Noise figure; Packaging; Schottky barriers; Stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1973 International
Type
conf
DOI
10.1109/IEDM.1973.188649
Filename
1477526
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