• DocumentCode
    3553733
  • Title

    A high-speed p-channel random access 1024-bit memory made with electron lithography

  • Author

    Henderson, R.C. ; Pease, R.F.W. ; Voshchenkov, A.M. ; Mallery, P. ; Wadsack, R.L.

  • Author_Institution
    Bell Telephone Laboratories, Murray Hill, New Jersey
  • Volume
    19
  • fYear
    1973
  • fDate
    1973
  • Firstpage
    138
  • Lastpage
    140
  • Abstract
    A switched capacitor, p-channel, 1024-- bit random access memory has been made with electron lithography. The circuit was the same as that described by Boll and Lynch (IEDM, 1972) but with halved lateral dimensions. For a given cell the gate length of the switching transistor was 4µm, and the chip size was 1.2×1.8mm. In order to fabricate the device, a 1µm alignment accuracy was required. Even with the modest shrinking of feature size, the minimum access time of the memory was reduced to less than 50 ns.
  • Keywords
    Circuit testing; Coils; Computer interfaces; Doping; Electron beams; Fabrication; Lithography; Random access memory; Scanning electron microscopy; Tungsten;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1973 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1973.188668
  • Filename
    1477545