DocumentCode :
3553733
Title :
A high-speed p-channel random access 1024-bit memory made with electron lithography
Author :
Henderson, R.C. ; Pease, R.F.W. ; Voshchenkov, A.M. ; Mallery, P. ; Wadsack, R.L.
Author_Institution :
Bell Telephone Laboratories, Murray Hill, New Jersey
Volume :
19
fYear :
1973
fDate :
1973
Firstpage :
138
Lastpage :
140
Abstract :
A switched capacitor, p-channel, 1024-- bit random access memory has been made with electron lithography. The circuit was the same as that described by Boll and Lynch (IEDM, 1972) but with halved lateral dimensions. For a given cell the gate length of the switching transistor was 4µm, and the chip size was 1.2×1.8mm. In order to fabricate the device, a 1µm alignment accuracy was required. Even with the modest shrinking of feature size, the minimum access time of the memory was reduced to less than 50 ns.
Keywords :
Circuit testing; Coils; Computer interfaces; Doping; Electron beams; Fabrication; Lithography; Random access memory; Scanning electron microscopy; Tungsten;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1973 International
Type :
conf
DOI :
10.1109/IEDM.1973.188668
Filename :
1477545
Link To Document :
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