DocumentCode
3553767
Title
Identification and characterization of excess noise sources in ICS by correlation analysis
Author
Conti, M. ; Corda, G. ; Conti, Marco ; Corda, G.
Author_Institution
SGS-ATES, Milano
Volume
19
fYear
1973
fDate
1973
Firstpage
248
Lastpage
250
Abstract
Correlation measurement of voltage noise present at input, output and other terminals of a linear IC makes possible the identification of the noisy components in spite of the circuit complexity. Structural defects responsible for noise have been identified both in the case of high 1/f noise and of burst noise. The role of stacking faults, dislocation loops and slip line dislocations in
Keywords
Circuit noise; Equivalent circuits; Feedback circuits; Integrated circuit noise; Low-frequency noise; Noise generators; Noise level; Noise measurement; Signal to noise ratio; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1973 International
Type
conf
DOI
10.1109/IEDM.1973.188699
Filename
1477576
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