DocumentCode

3553784

Title

Beam acceptance of silicon silicon-dioxide memory tubes

Author

Carasso, M.G.

Author_Institution

Philips Research Laboratories, Eindhoven-The Netherlands

Volume

19

fYear

1973

fDate

1973

Firstpage

301

Lastpage

303

Keywords

Cathodes; Electrons; Equations; Insulation; Laboratories; Periodic structures; Rough surfaces; Silicon; Surface roughness; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices Meeting, 1973 International

Type

conf

DOI

10.1109/IEDM.1973.188714

Filename

1477591