New self-scanned structures: resistive-MOS-gated diode arrays

Author

Whelan, M V ; Daverveld, L.A.

Author_Institution

Philips Research Laboratories, Eindhoven, Netherlands

Volume

fYear

1973

fDate

1973

Firstpage

416

Lastpage

418

Keywords

Collision mitigation; Contact resistance; Diodes; Electrodes; Frequency; Insulation; Laboratories; Oscilloscopes; Silicon; Threshold voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices Meeting, 1973 International

Type

DOI

10.1109/IEDM.1973.188747

Filename

1477624

Link To Document