Title :
Measurement of ultrashort X-ray pulses
Author :
Glover, T.E. ; Schoenlein, R.W. ; Chin, A.H. ; Shank, C.V.
Author_Institution :
Berkeley Nat. Lab., CA, USA
Abstract :
Summary form only given. We report demonstration of a visible/X-ray cross-correlation technique based on laser-assisted X-ray photoionization which has been used to measure 50-fs soft X-ray pulses. The technique is widely applicable to soft and hard X-rays and permits the first direct measurements on the duration of femtosecond high order harmonic radiation. A laser pulse (800 nm, 70 fs) generates high-order harmonic radiation through interaction with an argon gas sample. The harmonic radiation is propagated to a second gas jet (helium), where soft X-ray photoionization generates photoelectrons that are analyzed with time-of-flight spectroscopy.
Keywords :
X-ray photoelectron spectra; helium neutral atoms; high-speed optical techniques; optical harmonic generation; photoionisation; time of flight spectra; 50 fs; 70 fs; 800 nm; Ar; Ar gas sample; He; femtosecond high order harmonic radiation; laser-assisted X-ray photoionization; photoelectrons; second gas jet; soft X-ray photoionization; soft X-ray pulses; time-of-flight spectroscopy; ultrashort X-ray pulses; visible/X-ray cross-correlation technique; Argon; Gas lasers; Helium; Ionization; Optical harmonic generation; Optical propagation; Optical pulse generation; Optical pulses; Pulse measurements; X-ray lasers;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 1996. QELS '96., Summaries of Papers Presented at the
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-55752-444-0
