• DocumentCode
    3553847
  • Title

    High power EBS diode studies

  • Author

    Harris, F.H. ; Pankey, T., Jr. ; Thomas, R.E. ; Haas, G.A.

  • Author_Institution
    Naval Research Lab., Washington, D. C.
  • Volume
    19
  • fYear
    1973
  • fDate
    1973
  • Firstpage
    509
  • Lastpage
    511
  • Abstract
    Recent studies of large area EBS diodes for use in a 1 kW 500 MHz CW application are given. Power dissipation of 55 watts CW on a 4 mm2diode has been obtained in excess of 1000 hours with no degradation in reverse voltage characteristics. At higher diode dissipation, current runaway was observed, and this was shown to be a function of the power dissipated in the diode, independent of diode voltage and current over a 100% change in diode voltage and current. The maximum diode dissipation has been related to voids in the braze to the heat sink. Diodes with void-free bonds have shown dissipation levels in excess of 100 watts CW but were limited by degassing problems in the tube. Failure with some void-free bonded EBS diodes was related to breakdown of small ( \\sim 3-10 µm) high conductive regions of the diodes observed with a Scanning Electron Microscope. Auger surface analysis has traced this to a possible residual phosphorus contamination on the top p layer due to removal of excess Al metallization during fabrication.
  • Keywords
    Bonding; Degradation; Diodes; Electric breakdown; Heat sinks; Metallization; Power dissipation; Scanning electron microscopy; Surface contamination; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1973 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1973.188771
  • Filename
    1477648