DocumentCode
3553882
Title
Trends in automatic testing of electronic devices
Author
Judge, David M.
Author_Institution
Giordano Associates Inc., Chesapeake, VA, USA
fYear
1991
fDate
7-10 Apr 1991
Firstpage
401
Abstract
A review of recent trends in the automated testing of electronic devices is presented for both commercial and military operations. The spinoffs from military ATE initiatives provide new opportunities for the commercial electronics industry. Improved software development tools reduce test development time. New ASICs (application-specific integrated circuits) for automatic test applications reduce hardware costs and increase portability. Combined as part of a PC-based system, these two strategies reduce the need for more costly ATE
Keywords
automatic test equipment; automatic testing; electronic equipment testing; military equipment; printed circuit testing; reviews; ASICs; PC-based system; automatic test software; automatic testing; circuit card testing; commercial electronics industry; electronic devices; military ATE; military operations; portability; review; software development tools; Application software; Application specific integrated circuits; Automatic testing; Circuit testing; Electronic equipment testing; Electronics industry; Hardware; Integrated circuit testing; Programming; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Southeastcon '91., IEEE Proceedings of
Conference_Location
Williamsburg, VA
Print_ISBN
0-7803-0033-5
Type
conf
DOI
10.1109/SECON.1991.147782
Filename
147782
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