Title :
Electron beam fabricated 0.5 µm gate GaAs Schottky-barrier field effect transistor
Author :
Ozdemir, F.S. ; Ladd, G. ; Wolf, E.D. ; Perkins, W.E. ; Hirsch, N. ; Cleary, F.W.
Author_Institution :
Hughes Research Laboratories, Malibu, Calif.
Abstract :
Summary form only given. A computer-controlled electron beam microfabrication system was used to fabricate a GaAs Schottky barrier field effect transistor with a 0.5 μm gate length. This result represents the first time a 0.5 μm gate microwave device has been fabricated by electron beam techniques. The fabrication process described in the paper is a viable method to make devices with submicron gates.
Keywords :
Electron beams; FETs; Gallium arsenide;
Conference_Titel :
Electron Devices Meeting (IEDM), 1974 International
Conference_Location :
Washigton, DC, USA
DOI :
10.1109/IEDM.1974.188799