Title :
Two-terminal reliability of hypercubes
Author :
Ahmed, Riaz M. ; Trahan, Jerry L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Louisiana State Univ., Baton Rouge, LA, USA
Abstract :
Two-terminal reliability is an important parameter in the design of reliable networks. The two-terminal reliability analysis problem for general stochastic networks is in the #P-complete class of computationally difficult problems. Thus, approximate methods are useful for quick reliability analysis. Two general algorithms for approximating the two-terminal reliability of hypercubes based on shortest paths between a source and a terminal are presented. Emphasis is placed on exploiting the regular structure of hypercubes to reduce the complexity of the computation
Keywords :
computational complexity; hypercube networks; multiterminal networks; reliability theory; algorithms; computational complexity; hypercubes; two-terminal reliability analysis; Application software; Complex networks; Computer network reliability; Computer networks; Design engineering; Hypercubes; Parallel algorithms; Parallel programming; Reliability engineering; Stochastic processes;
Conference_Titel :
Southeastcon '91., IEEE Proceedings of
Conference_Location :
Williamsburg, VA
Print_ISBN :
0-7803-0033-5
DOI :
10.1109/SECON.1991.147789
