DocumentCode :
3553943
Title :
Theoretical and experimental evaluation of a high efficiency graded band-gap n/p AlxGa1-xAs-GaAs solar cell
Author :
Hutchby, J.A. ; Sahai, R. ; Harris, J.S.
Author_Institution :
NASA Langley Research Center, Hampton, Virginia
Volume :
21
fYear :
1975
fDate :
1975
Firstpage :
91
Lastpage :
94
Abstract :
Theoretical and experimental analyses show that the higher energy spectral response of an n/p AlxGa1-xAs-GaAs graded band-gap solar cell is substantially greater than that of a similar n/p AlxGa1-xAs-GaAs heteroface cell, particularly for wavelengths below 0.5 µm. The theoretical analysis includes all practical energy loss mechanisms such as photon reflection; surface, bulk, and junction recombination currents; and series resistance. It predicts air mass zero (AMO) efficiencies of 16.7% for standard transport parameters and a surface recombination velocity (S) of 1 \\times 10^{6} cm/sec and 17.7% for S = 1 \\times 10^{5} cm/sec. Small, preliminary n/p graded band-gap structures have been fabricated using a new LPE, melt mixing growth technique to obtain the graded composition AlxGa1-xAs layer approximately 0.5 µm thick. Comparison of the measured spectral responses of the graded band-gap cell with similar n/p heteroface structures (x = 0.85) demonstrates substantial improvement provided by the graded cell for wavelengths between 0.60 µm and 0.35 µm . Preliminary electrical measurements performed in a calibrated AMO solar simulator on structures with a Si3N4anti-reflection film indicate maximum power conversion efficiency of 13.6% (for zero contact area). This efficiency corresponds to measured short-circuit current density, JSC, of 27.7 ma/cm2, open-circuit voltage, VOC, of 0.88 volts, and fill factor, FF, of 0.76. Individual values of JSCVOC, and FF as high as 28.2 ma/cm2, 0.95 volts, and 0.78 have been measured, each for a separate cell.
Keywords :
Area measurement; Electric variables measurement; Energy loss; Photonic band gap; Photovoltaic cells; Power measurement; Reflection; Spontaneous emission; Surface resistance; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1975 International
Type :
conf
DOI :
10.1109/IEDM.1975.188832
Filename :
1478193
Link To Document :
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