• DocumentCode
    3554006
  • Title

    Charge coupled F.E.T. devices (C.C.F.E.T.)

  • Author

    Shannon, J.M. ; Board, K. ; Brotherton, S.D. ; Gill, A

  • Author_Institution
    Mullard Research Laboratories, Surrey, England
  • Volume
    21
  • fYear
    1975
  • fDate
    1975
  • Firstpage
    320
  • Lastpage
    323
  • Abstract
    A charge coupled F.E.T. array is described which gives an amplified, non-destructive measure of the size of the charge packet under each electrode of a CCD line. The basic concept uses the fact that the surface potential and consequently the depth of the depletion layer under any electrode of a CCD line is sensitive to the size of the Charge packet under that electrode. As a result, an integral array of F.E.T´s can be formed simply by changing the electrode structure of one of the phases. Results from a four bit surface channel device in an n-type layer on a p-type substrate are used to illustrate the basic properties of the device.
  • Keywords
    Charge coupled devices; Charge measurement; Current measurement; Electrodes; Etching; Laboratories; Phased arrays; Size measurement; Space charge; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1975 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1975.188889
  • Filename
    1478250