• DocumentCode
    3554007
  • Title

    Multilevel random access memory using one JFET per cell

  • Author

    Heald, A. Raymond ; Hodges, A. David

  • Author_Institution
    University of Washington, Seattle, Wash.
  • Volume
    21
  • fYear
    1975
  • fDate
    1975
  • Firstpage
    324
  • Lastpage
    327
  • Abstract
    A memory cell capable of storing multilevel or analog information and providing random-access operation with nondestructive readout has been studied. It used a single junction field-effect transistor as the storage cell. Experimental and analytical studies suggest that eight or sixteen level operation should be feasible with refresh operations every 0.1 to 1 second; cell area can be under 2 mil2.
  • Keywords
    DRAM chips; FETs; Leakage current; MOSFETs; Optical arrays; Random access memory; Read-write memory; Signal design; Surface discharges; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1975 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1975.188890
  • Filename
    1478251