DocumentCode :
3554007
Title :
Multilevel random access memory using one JFET per cell
Author :
Heald, A. Raymond ; Hodges, A. David
Author_Institution :
University of Washington, Seattle, Wash.
Volume :
21
fYear :
1975
fDate :
1975
Firstpage :
324
Lastpage :
327
Abstract :
A memory cell capable of storing multilevel or analog information and providing random-access operation with nondestructive readout has been studied. It used a single junction field-effect transistor as the storage cell. Experimental and analytical studies suggest that eight or sixteen level operation should be feasible with refresh operations every 0.1 to 1 second; cell area can be under 2 mil2.
Keywords :
DRAM chips; FETs; Leakage current; MOSFETs; Optical arrays; Random access memory; Read-write memory; Signal design; Surface discharges; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1975 International
Type :
conf
DOI :
10.1109/IEDM.1975.188890
Filename :
1478251
Link To Document :
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