DocumentCode :
3554035
Title :
Borsenic bipolar process
Author :
Saraswat, Krishna C. ; Meindl, James D.
Author_Institution :
Stanford University, Stanford, California
Volume :
21
fYear :
1975
fDate :
1975
Firstpage :
437
Lastpage :
439
Abstract :
A new process utilizing simultaneous diffusion of Boron and Arsenic (Borsenic) from doped oxide, to fabricate high performance bipolar transistors has been developed. The doped oxide is deposited at low temperature by oxidation of SiH4, B2H6and AsH3. Since As diffuses much slower than B in Si, by heating the doped oxide at high temperatures n+-p-n structures have been obtained. By varying the time and temperature of diffusion or by varying As or B content in the oxide, we have fabricated from extremely shallow (e.g. X_{EB} \\simeq 0.3 \\\\mu, W_{BASE} = 0.15\\\\mu ) to fairly deep (e.g X_{EB} \\simeq 2\\\\mu, W_{BASE} = 0.4\\\\mu ) bipolar transistors. Details of the fabrication process and properties of the transistors are presented here.
Keywords :
Bipolar transistors; Boron; Diffusion processes; Epitaxial layers; Etching; Fabrication; Heating; Inductors; Oxidation; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1975 International
Type :
conf
DOI :
10.1109/IEDM.1975.188916
Filename :
1478277
Link To Document :
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