DocumentCode :
3554066
Title :
Optimized load device for DMOS integrated circuits
Author :
Lin, H.C. ; Halsor, J.L. ; Benz, H.F.
Author_Institution :
University of Maryland, College Park, Maryland
Volume :
21
fYear :
1975
fDate :
1975
Firstpage :
547
Lastpage :
550
Abstract :
Depletion-mode load devices can be integrated with DMOS transistors without any extra diffusions or ion implantation processing steps by judicious choice of the substrate crystal orientation and resistivity. For low voltage operation, (1,1,1) crystal orientation also yields a higher transconductance for the DMOS transistor than the (1, 0, 0) orientation. The geometry of the load device and the DMOS transistor can be made ratioless to conserve area. Self-aligned gates, hitherto considered incompatible with DMOS transistors, has been incorporated in the structure. The experimental DMOS inverters, using a conservative design, have achieved 4 ns propagation delay, 1.3V operation and 2 pJ propagation delay-power dissipation product.
Keywords :
Dielectric constant; Doping; Educational institutions; Geometry; Inverters; Low voltage; NASA; Propagation delay; Switches; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1975 International
Type :
conf
DOI :
10.1109/IEDM.1975.188944
Filename :
1478305
Link To Document :
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