DocumentCode :
3554132
Title :
Junction modeling for solar cells - Theory and experiment
Author :
Lindholm, F.A. ; Neugroschel, A. ; Sah, C.T.
Author_Institution :
University of Florida, Gainesville, Florida
fYear :
1976
fDate :
6-8 Dec. 1976
Firstpage :
61
Lastpage :
64
Abstract :
This paper describes methods that enable us to experimentally determine the recombination lifetimes in the emitter and base of a p-n-junction solar cell and the energy-gap shrinkage in the emitter for the first time. The methods integrate experiment with theory such that the quantitative analysis of the measurements is rigorously based on the underlying device physics.
Keywords :
Diodes; Electric variables; Electric variables measurement; NASA; P-n junctions; Photovoltaic cells; Physics; Semiconductor process modeling; Silicon; Solar energy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1976 International
Conference_Location :
Washigton, DC, USA
Type :
conf
DOI :
10.1109/IEDM.1976.188985
Filename :
1478697
Link To Document :
بازگشت