• DocumentCode
    3554144
  • Title

    Transient analysis of the TRAPATT mode

  • Author

    Khochnevis-Rad, M. ; Lomax, R.J. ; Haddad, G.I.

  • Author_Institution
    University of Michigan, Ann Arbor, MI
  • Volume
    22
  • fYear
    1976
  • fDate
    1976
  • Firstpage
    106
  • Lastpage
    109
  • Abstract
    A computer study of a TRAPATT device-circuit interaction has been performed in the time domain under various conditions of pulse rise time and current density. For a 4.3-ns rise-time pulse at 12,000 A/cm2, a movie will be shown which shows the voltage on the coaxial circuit together with the carrier concentrations and electric field in the diode during the starting transient and for one TRAPATT cycle. These results are not adequately explained by existing theory which indicates that a pulse reflected from the circuit triggers the subsequent cycle. Transient and TRAPATT operation of the p+nn+and n+pp+devices will be discussed and compared.
  • Keywords
    Capacitors; Circuit simulation; Coaxial components; Diodes; Electron traps; Packaging; Power system transients; Pulse circuits; Transient analysis; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1976 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1976.188996
  • Filename
    1478708