DocumentCode :
3554166
Title :
The effect of operating frequency on propagation delay in silicon-on-sapphire digital integrated circuits
Author :
Eaton, S. Sheffield ; Lalevic, B.
Author_Institution :
RCA, Solid State Division, Somerville NJ
Volume :
22
fYear :
1976
fDate :
1976
Firstpage :
192
Lastpage :
194
Abstract :
The propagation delay between any two nodes in a silicon-on-sapphire MOS digital integrated circuit operating at supply voltages near transistor threshold has been observed to be a function of the operating frequency. This effect is attributed to a transient drain current whose magnitude decreases with increasing frequency of applied gate voltage. Evidence of this relationship is discussed as well as possible explanations for the origin of the transient current.
Keywords :
Circuit testing; Counting circuits; Digital circuits; Digital integrated circuits; Frequency; Inverters; Propagation delay; Silicon; Solid state circuits; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1976 International
Type :
conf
DOI :
10.1109/IEDM.1976.189016
Filename :
1478728
Link To Document :
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