DocumentCode
3554337
Title
LSI and VLSI research in Japan
Author
Tarui, Yasuo
Author_Institution
VLSI Tech. Res. Assoc., Kawasakishi, Japan
Volume
23
fYear
1977
fDate
1977
Firstpage
2
Lastpage
6
Abstract
This report will review recent advancements in LSI and VLSI research in Japan, especially concerning the basic technology useful for microfabrica-tion. The first computer controlled vector scan electron beam exposure system in Japan was reported in 1967. Recently the variable-area rectangular technique has been experimentally pursued. Another group is working on probe forming by quadrupole lenses. In the processing field, a high frequency plasma system, a plasma transport system, and a high pressure oxidation system are under development. Various self-aligning devices, like Diffusion Self-Alignment, Multiple Wall Self-Alignment, and those which work near punch-through regions are described.
Keywords
Control systems; Electric variables control; Electron beams; Large scale integration; Lenses; Plasma devices; Plasma materials processing; Plasma transport processes; Probes; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1977 International
Type
conf
DOI
10.1109/IEDM.1977.189139
Filename
1479219
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