DocumentCode
3554472
Title
Gax In1-x Sb for high speed transferred electron devices
Author
Kawashima, M. ; Ohta, K. ; Kataoka, S.
Author_Institution
Electrotechnical Laboratory, Tokyo, Japan
Volume
23
fYear
1977
fDate
1977
Firstpage
372
Lastpage
374
Abstract
Foundamental properties of the transferred electron effect of LPE grown Gax In1-x Sb have been measured. Low threshold field, 400-600 V/cm, (0.4 ≤ x ≤ 0.8), low constant domain velocity, 5 × 106cm/sec, (0.55 ≤ x ≤ 0.8 ), and low impact ionization rate in the domain makes this material promising for high speed logic devices. Smaller power-delay poduct, about 1/50 of that of GaAs Gunn logic (20fJ) is expected, using an optimum Ga composition x=0.8.
Keywords
Diodes; Electrons; Gallium arsenide; Gunn devices; Impact ionization; Logic devices; Microwave devices; Microwave oscillators; Performance evaluation; Temperature dependence;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1977 International
Type
conf
DOI
10.1109/IEDM.1977.189262
Filename
1479342
Link To Document