Title :
Evaluation and design optimization of piezoresistive gauge factor of thick-film resistors
Author :
Song, C. ; Kerns, D.V., Jr. ; Davidson, J.L. ; Kang, W. ; Kerns, S.
Author_Institution :
Dept. of Electr. Eng., Vanderbilt Univ., Nashville, TN, USA
Abstract :
On the basis of the analysis of all the thick-film design methodologies, the authors designed a test sample on which four different length-over-width ratios of resistors were designed. They found that the length-over-width ratio will substantially affect the gauge factor in some cases, in contrast to prior research. This can be modeled to generate a linear predictive model, The sensors designed on the insulator and the sensors underneath the insulator were also studied in order to simulate the multilayer hybrid technology and study the effects of insulator-resistor-substrate surface interaction. It is demonstrated that design techniques can affect the strain sensitivity of thick-film resistors
Keywords :
piezoresistance; strain gauges; thick film resistors; design optimization; insulator-resistor-substrate surface interaction; length-over-width ratios; linear predictive model; multilayer hybrid technology; piezoresistive gauge factor; sensors; strain sensitivity; test sample; thick-film resistors; Capacitive sensors; Design methodology; Design optimization; Hybrid power systems; Insulation; Nonhomogeneous media; Piezoresistance; Predictive models; Resistors; Testing;
Conference_Titel :
Southeastcon '91., IEEE Proceedings of
Conference_Location :
Williamsburg, VA
Print_ISBN :
0-7803-0033-5
DOI :
10.1109/SECON.1991.147935