• DocumentCode
    3554481
  • Title

    DIMOS - A novel IC technology with submicron effective channel MOSFETs

  • Author

    Tihanyi, J. ; Widmann, D.

  • Author_Institution
    SIEMENS AG, MUNICH, GERMANY
  • Volume
    23
  • fYear
    1977
  • fDate
    1977
  • Firstpage
    399
  • Lastpage
    401
  • Abstract
    A DIMOS transistor is physically similar to the diffusion self-aligned (or double diffused) transistor, but it has a shorter submicron effective channel. This very short channel is realized by subsequent ion implantations using a ramp-shaped or stepped polysilicon gate electrode as an implantation mask for the source and channel doping. Ramp gate and stepped gate DIMOS transistors have been fabricated. ICs with ramp gate DIMOS transistors have been studied in more detail. Ring oscillators show a propagation delay of 230 ps per stage. The fabrication process is a slightly modified polysilicon gate process usingstandard photolithography.
  • Keywords
    Doping; Fabrication; Geometry; Ion implantation; Lithography; MOSFETs; Propagation delay; Roentgenium; Shape control; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1977 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1977.189270
  • Filename
    1479350