• DocumentCode
    3554501
  • Title

    Bias-assisted photoemission in the 1-2 micron range

  • Author

    Escher, J.S. ; Gregory, P.E. ; Hyder, S.B. ; Houng, Y.M. ; Antypas, G.A.

  • Author_Institution
    Varian Associates, Inc., Palo Alto, CA
  • Volume
    23
  • fYear
    1977
  • fDate
    1977
  • Firstpage
    460
  • Lastpage
    464
  • Abstract
    Experimental photoemission data are presented on a new type of bias-assisted photocathode employing the transferred-electron effect. The cathodes are heterostructures employing lattice-matched InP-InGaAsP alloys. Reflection mode yields up to 1.0% out to 1.7-micron threshold have been achieved in an ultra-high vacuum experimental photoemission system.
  • Keywords
    Cathodes; Electrons; Elementary particle vacuum; Indium phosphide; Laboratories; Photoelectricity; Photonic band gap; Surface treatment; Tellurium; Vacuum systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1977 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1977.189289
  • Filename
    1479369
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3554501