Title :
Bias-assisted photoemission in the 1-2 micron range
Author :
Escher, J.S. ; Gregory, P.E. ; Hyder, S.B. ; Houng, Y.M. ; Antypas, G.A.
Author_Institution :
Varian Associates, Inc., Palo Alto, CA
Abstract :
Experimental photoemission data are presented on a new type of bias-assisted photocathode employing the transferred-electron effect. The cathodes are heterostructures employing lattice-matched InP-InGaAsP alloys. Reflection mode yields up to 1.0% out to 1.7-micron threshold have been achieved in an ultra-high vacuum experimental photoemission system.
Keywords :
Cathodes; Electrons; Elementary particle vacuum; Indium phosphide; Laboratories; Photoelectricity; Photonic band gap; Surface treatment; Tellurium; Vacuum systems;
Conference_Titel :
Electron Devices Meeting, 1977 International
DOI :
10.1109/IEDM.1977.189289
