DocumentCode :
3554531
Title :
PbS-Si anisotype heterojunction characteristics
Author :
Steckl, A.J. ; Elabd, H. ; Jakobus, Th.
Author_Institution :
Rensselaer Polytechnic Institute, Troy, New York
Volume :
23
fYear :
1977
fDate :
1977
Firstpage :
549
Lastpage :
550
Abstract :
The operation of p-n PbS-Si heterojunction devices at 200 K and 300 K is reported. The I-V and C-V characteristics are presented and compared to those of p-p heterojunctions. At 200 K and a wavelength of 2.7 µm, the open circuit detectivity and voltage responsivity achieved are D*λ(100 Hz, 1 Hz) = 4 × 109cm Hz1/2/W and RV, λ(100 Hz) = 4 × 103V/W. Under the same conditions but in short circuit, zero bias operation, the detector performance achieved is, D*λ(100 Hz, 1 Hz = 3.4 × 109cm Hz1/2/W and RI, λ, = 4.8 × 10-4A/W.
Keywords :
Capacitance-voltage characteristics; Circuits; Detectors; Fabrication; Heterojunctions; Photoconductivity; Signal to noise ratio; Temperature dependence; Tunneling; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1977 International
Type :
conf
DOI :
10.1109/IEDM.1977.189316
Filename :
1479396
Link To Document :
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