DocumentCode
355454
Title
Surface second harmonic generation from Si/SiO/sub 2/ and GaAs using 10-fs pulses
Author
Cundiff, S.T. ; Knox, Wayne H. ; Baumann, F.H.
Author_Institution
AT&T Bell Labs., Holmdel, NJ, USA
fYear
1996
fDate
7-7 June 1996
Firstpage
86
Lastpage
87
Abstract
Summary form only given. The surface selectivity of surface second harmonic generation (SSHG) in centrosymmetric materials makes it a very powerful tool for studying surfaces. The Si-SiO/sub 2/ interface is of particular interest because of its critical role in integrated circuits. SSHG has been used to study surface steps, straining of subsurface bonds, and surface roughness. Early experiments using nanosecond pulses were actually limited by the laser-induced damage to the surfaces, which has resulted in the use of ps and 100 fs pulses to obtain good signal to noise with lower average powers (/spl sim/1 W for 100-fs pulses). We show that by using 10-fs pulses the average power can be reduced to <30 mW with acceptable signal to noise. Additionally we can observe resonance behavior by simply spectrally resolving the SSHG signal.
Keywords
III-V semiconductors; elemental semiconductors; gallium arsenide; high-speed optical techniques; optical harmonic generation; semiconductor-insulator boundaries; silicon; silicon compounds; surface phenomena; 10 fs; 30 mW; GaAs; GaAs surface; Si-SiO/sub 2/; Si-SiO/sub 2/ interface; centrosymmetric material; femtosecond pulse; resonance; surface second harmonic generation; Frequency conversion; Integrated circuit noise; Laser noise; Noise reduction; Optical pulses; Power lasers; Resonance; Rough surfaces; Surface emitting lasers; Surface roughness;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science Conference, 1996. QELS '96., Summaries of Papers Presented at the
Conference_Location
Anaheim, CA, USA
Print_ISBN
1-55752-444-0
Type
conf
Filename
865603
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