DocumentCode
3554587
Title
Fine line lithography systems for VLSI
Author
Broers, A.N.
Author_Institution
IBM T. J. Watson Research Center, Yorktown Heights, NY, U.S.A.
Volume
24
fYear
1978
fDate
1978
Firstpage
1
Lastpage
5
Abstract
This paper discusses advantages and disadvantages of advanced lithography techniques under investigation for the fabrication of semiconductor integrated circuits. These techniques are replacing conventional ultra-violet (UV) contact/proximity printing. They employ standard UV radiation (λ = 3500Å-4000ÅA), deep UV radiation (λ = 2000Å-2600Å), soft x-rays (λ = 4Å-40Å), and electrons. It is assumed that the reader is familiar with the basic principles of the new methods.
Keywords
Cost function; Electron beams; Electron optics; Fabrication; Optical distortion; Optical scattering; Printing; Resists; Very large scale integration; X-ray lithography;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1978 International
Type
conf
DOI
10.1109/IEDM.1978.189338
Filename
1479763
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