Title :
Fine line lithography systems for VLSI
Author_Institution :
IBM T. J. Watson Research Center, Yorktown Heights, NY, U.S.A.
Abstract :
This paper discusses advantages and disadvantages of advanced lithography techniques under investigation for the fabrication of semiconductor integrated circuits. These techniques are replacing conventional ultra-violet (UV) contact/proximity printing. They employ standard UV radiation (λ = 3500Å-4000ÅA), deep UV radiation (λ = 2000Å-2600Å), soft x-rays (λ = 4Å-40Å), and electrons. It is assumed that the reader is familiar with the basic principles of the new methods.
Keywords :
Cost function; Electron beams; Electron optics; Fabrication; Optical distortion; Optical scattering; Printing; Resists; Very large scale integration; X-ray lithography;
Conference_Titel :
Electron Devices Meeting, 1978 International
DOI :
10.1109/IEDM.1978.189338