• DocumentCode
    3554587
  • Title

    Fine line lithography systems for VLSI

  • Author

    Broers, A.N.

  • Author_Institution
    IBM T. J. Watson Research Center, Yorktown Heights, NY, U.S.A.
  • Volume
    24
  • fYear
    1978
  • fDate
    1978
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper discusses advantages and disadvantages of advanced lithography techniques under investigation for the fabrication of semiconductor integrated circuits. These techniques are replacing conventional ultra-violet (UV) contact/proximity printing. They employ standard UV radiation (λ = 3500Å-4000ÅA), deep UV radiation (λ = 2000Å-2600Å), soft x-rays (λ = 4Å-40Å), and electrons. It is assumed that the reader is familiar with the basic principles of the new methods.
  • Keywords
    Cost function; Electron beams; Electron optics; Fabrication; Optical distortion; Optical scattering; Printing; Resists; Very large scale integration; X-ray lithography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1978 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1978.189338
  • Filename
    1479763