• DocumentCode
    3554682
  • Title

    Novel high density, stacked capacitor MOS RAM

  • Author

    Koyanagi, M. ; Sunami, H. ; Hashimoto, N. ; Ashikawa, M.

  • Author_Institution
    Hitachi Ltd., Kokubunji, Tokyo, Japan
  • Volume
    24
  • fYear
    1978
  • fDate
    1978
  • Firstpage
    348
  • Lastpage
    351
  • Abstract
    A novel one transistor type MOS RAM cell is successfully developed and achieves a higher degree of integration than realized to date with conventional RAM´s. This cell provides remarkable area reduction and/or an increase in storage capacitance by stacking the main portion of the storage capacitor on the address transistor. It is called a stacked capacitor RAM (STC RAM) cell. This new cell has a triple level poly-Si structure of poly-Si word lines and Al bit lines. The stacked capacitor is composed of a poly-Si - Si3N4- poly-Si structure. A 256 bit STC MOS RAM is fabricated with 3 µm technology and operates successfully. The STC RAM cell area, 52.5 µm2, is remarkably smaller than the cell area of conventional RAM´s with double level poly-Si gate structure, 160 µm2.
  • Keywords
    Capacitance; Fabrication; Laboratories; Leakage current; MOS capacitors; MOSFETs; Random access memory; Read-write memory; Stacking; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1978 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1978.189425
  • Filename
    1479850