DocumentCode :
3554712
Title :
Arsenic emitter effects
Author :
Wieder, Armin W.
Author_Institution :
Institut f. Theoretische Elektrotechnik, TH-Aachen, Germany
Volume :
24
fYear :
1978
fDate :
1978
Firstpage :
460
Lastpage :
462
Abstract :
Recombination mechanisms and bandgap narrowing effects have proven to affect device performance significantly. The trend to minimum size devices stresses the significance of these effects even more so. Nevertheless bandgap narrowing effects have only been measured at devices for boron and not yet for n-type material. These effects, however, are of most interest in the heavily doped regions of emitters and subcollectors.
Keywords :
Absorption; Bipolar transistors; Boron; Impurities; Mechanical factors; Photonic band gap; Process control; Silicon; Stress; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1978 International
Type :
conf
DOI :
10.1109/IEDM.1978.189454
Filename :
1479879
Link To Document :
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