Title :
Arsenic emitter effects
Author :
Wieder, Armin W.
Author_Institution :
Institut f. Theoretische Elektrotechnik, TH-Aachen, Germany
Abstract :
Recombination mechanisms and bandgap narrowing effects have proven to affect device performance significantly. The trend to minimum size devices stresses the significance of these effects even more so. Nevertheless bandgap narrowing effects have only been measured at devices for boron and not yet for n-type material. These effects, however, are of most interest in the heavily doped regions of emitters and subcollectors.
Keywords :
Absorption; Bipolar transistors; Boron; Impurities; Mechanical factors; Photonic band gap; Process control; Silicon; Stress; Vehicles;
Conference_Titel :
Electron Devices Meeting, 1978 International
DOI :
10.1109/IEDM.1978.189454